SP-01,Scratch Pin Probe 亂寫探針
SP-01,Scratch Pin Probe 亂寫探針,基于IEC標準,適用表面絕緣層的磨擦試驗,品牌:美國.ED&D
| OTHER SAFETY PRODUCTS 其它**測試 |
| SP-01,Scratch Pin Probe 亂寫探針 |
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Used to test resistance to abrasion on insulating materials and conformal coatings. Hardened steel pin, the end is a cone having a top angle of 40 degrees, tip is rounded with a radius of 0.25 ± 0.02 mm. Complies with many Standards, including IEC based Standards. Entire scratch test apparatus available. |
美國.ED&D產(chǎn)品服務(wù)于:IBM ，美國航空暨太空總署，英代爾，蘋果， NCR ，索尼公司，太陽，飛利浦公司，思科， AT&T ， Compaq ， JVC ， Hewlett-Packard ，摩托羅拉， Mattel ，戴爾,3 Com 等公司;專為UL ， CSA ， ETL ， TUV,Demko等試驗室提供檢測產(chǎn)品.
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SP-01,Scratch Pin Probe 亂寫探針
SP-01,Scratch Pin Probe 亂寫探針
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