TFP-01,Test Finger Probe (IEC試驗(yàn)指)
TFP-01,Test Finger Probe (IEC試驗(yàn)指),符合: IEC, EN,CSA,UL標(biāo)準(zhǔn).(品牌:美國.ED&D) ULP-02,Articulated Probe with Discs(關(guān)節(jié)試驗(yàn)指),符合UL標(biāo)準(zhǔn).(品牌:美國.ED&D) ULP-02,Articulated Probe with Discs(UL關(guān)節(jié)試驗(yàn)指)
TFP-01,Test Finger Probe (IEC試驗(yàn)指),符合: IEC, EN,CSA,UL標(biāo)準(zhǔn).(品牌:美國.ED&D) ULP-02,Articulated Probe with Discs(關(guān)節(jié)試驗(yàn)指),符合UL標(biāo)準(zhǔn).(品牌:美國.ED&D) ULP-02,Articulated Probe with Discs(UL關(guān)節(jié)試驗(yàn)指)
Model TFP-01: Test Finger Probe(IEC試驗(yàn)指)
| This is the “International” test finger required by most IEC, EN and CSA Standards, in addition to many UL Standards. Built in strict accordance to the newest requirements - with integral palm simulator. This is the ONLY Finger Probe available with a integral jack in the handle for continuity testing - as mandated by the IEC CB Scheme. Finger made of chrome plated steel. All parts precision machined. |
美國.ED&D產(chǎn)品服務(wù)于:IBM ，美國航空暨太空總署，英代爾，蘋果， NCR ，索尼公司，太陽，飛利浦公司，思科， AT&T ， Compaq ， JVC ， Hewlett-Packard ，摩托羅拉， Mattel ，戴爾,3 Com 等公司;專為UL ， CSA ， ETL ， TUV,Demko等試驗(yàn)室提供檢測產(chǎn)品.
TFP-01,Test Finger Probe (IEC試驗(yàn)指)
IEC試驗(yàn)指
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